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iTEM Solution EFTEM - Getting the most out of your energy filtered TEM
Key features
Scandium Solution Detection
  • Integrated EELS atlas containing reference spectra
  • Remote control of EFTEM and periphery devices
  • Generating and processing ESI element maps and EELS spectra
  • Numerous options of energy and intensity calibration
Summary
iTEM Solution EFTEM offers acquisition, processing and evaluation routines for all prevailing methods of energy-filtered electron microscopy. This applies to the Image EELS and ESI methods, both being methods mainly used for analysis and visualization of even the lowest levels of element concentration. The software offers fast and effortless generation of highly resolved element diffraction maps accompanied by extensive information on the chemical composition of the structure. Parallel and serial EELS spectra can also be acquired using iTEM Solution EFTEM. When conducting more extensive analysis, spectra can be quantified within the software, and specimen thickness can be determined right away. iTEM Solution EFTEM also offers an impressive variety of spectra-processing functions. This solution includes an EELS atlas with a wide range of reference spectra as well as automatic generation of spectral information.
Description Specifications
Product iTEM Solution EFTEMSolution EFTEM
iTEM Solution EFTEM
ESI R-Map
Image EELS Drift correction
Analyzing
Convenient display of elemental maps by various image mixing/ superimposition functions
Drift correction
Parallel EELS ESI mapping
Quality check (movie of planes)
Various ROI selection tools (eg, magic wand)
Spectrum display in real time
Direct acquisition of spectra to CCD camera
Serial EELS Acquisition control: time or surface accumulation
Automatic calibration and control of gain and energy shift
Wide range P-EELS supported
Spectra Processing EELS Atlas with reference spectra for all common elements
Quantification Auto scaling
Single or multiple spectra (up to 8 spectra simultaneously)
Display filters and numerical filters
Automatic peak identification, automatic element labelling
Zero-loss calibration
Integration, background subtraction
Deconvolution: Fourier log
Gain-split functionality
Element ratio and ratio map
Other Compute specimen thickness from spectrum and/or image (interactive)
Automatic generation of spectrum information saved with the image
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KeenView G2
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KeenViewG2 - Fast bottom-mounted TEM Camera. Optimized for applications like Virology, EFTEM, Diffraction, CBED analysis, Tomography, Immunogold labeling analysis or Cyro and Low Dose imaging.


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iTEM platform
iTEM platform
iTEM is the premier image analysis platform for TEM. It includes automation, processing, analysis, visualization, archiving, and report generation.


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support
If you have any questions, please feel free to contact us. Click the image or the link to find out about phone, fax, and email.


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