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iTEM Solution Diffraction - Index Diffraction Patterns automatically
Key features
iTEM Solution Diffraction
  • Automatic analysis and indexing of digital electron diffraction pattern
  • Determination of reciprocal units
  • Direct readout of camera length
Summary
The iTEM Solution Diffraction is the extension level for digital electron diffraction pattern analysis which provides important information on the microstructure of crystalline materials. The Solution Diffraction enables the TEM user to automatically analyze and index diffraction patterns of both single crystalline and polycrystalline samples and FFTs. Diffraction patterns are calibrated directly in corresponding reciprocal units according to the camera length read out from the TEM if applicable. The range of functions includes highly accurate measurement of distances and angles as well as functions for archiving and reporting – all integrated within the comprehensive interactive measurement features of iTEM
Description Specifications
The iTEM Solution Diffraction extension makes it possible to automatically index, evaluate, measure and analyze diffraction patterns. As with all other extensions, the iTEM Diffraction is fully integrated with iTEM. The base-level version offers numerous functions for processing, analysis, visualization and archiving of images and other data as well as for automation and report generation. With its solution-oriented software extensions, iTEM's range of functions can be precisely expanded according to the user's needs.
Indexing diffraction patterns
Via iTEM Diffraction, diffraction patterns (SAED) of both single crystalline and polycrystalline samples can be indexed. After the crystal structure and lattice parameters have been defined, indexing is conducted via threshold detection (automatically) or via definition of the two g vectors (manually). Alongside the Miller indices, the zone axis is shown as the indexing result within the image overlay. The related lattice distances may be listed in a sheet automatically as needed. All data, including the image information is saved with the diffraction image.
Measuring within diffraction images
The Diffraction iTEM Solution offers easy analysis of diffraction patterns. Lattice plane distances are simple to measure as well as the angles between two different planes. The integrated snap function - which can be switched on and off - ensures the greatest possible precision. The snap function locates the brightest ambient point automatically and then uses this as a point of measurement.
Required Software
* iTEM Software
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iTEM platform
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